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| Component Testers | ||
| Model | Description | Ref # | |
| Advantest 3324 | VLSI Tester Parts Machine | COM21 | |
| Advantest T3324 | VLSI Tester Parts Machine | COM263 | |
| Advantest T3347 | VLSI Tester Parts Machine | COM249 | |
| Advantest T5335P | Memory Tester | COM258 | |
| Advantest T5335 | Memory Tester -Parts Machine | COM158 | |
| Advantest T5335 | Memory Tester | COM283 | |
| Advantest T5365P | Memory Tester-Parts Machine | COM198 | |
| Advantest T5381 | Memory Tester | COM252 | |
| Advantest T5581H | Memory Tester | COM332 | |
| Advantest T5382A | Memory Tester | COM173 | |
| Advantest T6673 | Mixed Signal Single Test Head SOC Test System | COM266 | |
| Advantest T6673 | Mixed Signal Dual Test Head SOC Test System | COM269 | |
| Agilent 93000 P1000 | Mixed Signal Tester | COM329 | |
| Agilent 93000 C400e | Mixed Signal Tester | COM330 | |
| Agilent 93000 C400e | Mixed Signal Tester | COM331 | |
| Agilent 93000 P600 | Mixed Signal Tester | COM310 | |
| Agilent 94000XL-IP | Mixed Signal Tester | COM279 | |
| Agilent 94000XL-IP | Mixed Signal Tester | COM280 | |
| Agilent V4400/V4436 | Memory Tester | COM284 | |
| Credence ASL 3000RF | RF Test System | COM324 | |
| Credence Duo | Mixed Signal Tester | COM69 | |
| Credence Duo | Mixed Signal Tester | COM96 | |
| Credence Duo XP | Mixed Signal Tester | COM120 | |
| Credence Duo XP | Mixed Signal Tester | COM121 | |
| Credence Duo SX | Mixed Signal Tester | COM122 | |
| Credence Duo SX | Mixed Signal Tester | COM123 | |
| Credence IMS Electra | Mixed Signal Tester | COM343 | |
| Credence LT1000 | Mixed Signal Tester | COM124 | |
| Credence LT1001 | Mixed Signal Tester | COM125 | |
| Credence Octet 200 | Mixed Signal Tester | COM342 | |
| Credence Cal Station | Credence Calibration Station for Credence Quartet and Credence Duo's | COM28 | |
| Credence Quartet | Mixed Signal Tester | COM300 | |
| Credence Quartet | Mixed Signal Tester | COM344 | |
| Credence Vista Vision | Mixed Signal Tester | COM35 | |
| EPRO 142AX | EPROM Tester | COM83 | |
| ESI 9800 | Laser Fuser | COM237 | |
| HILEVEL ETS300 | Digital Test System | COM15 | |
| HILEVEL ETS300 | Digital Test System | COM16 | |
| HP 4062UX | Parametric Tester Parts Machine | COM216 | |
| HP 4062UX | Parametric Tester | COM232 | |
| HP 4062UX | Parametric Tester | COM235 | |
| HP82000 | D100 VLSI Tester 100 Mhz 96 pins | COM2 | |
| HP82000 | D200 VLSI Tester 200 Mhz up to 240 pins | COM3 | |
| HP82000 | D100 VLSI Tester 100 Mhz 176 pins | COM19 | |
| HP82000 | D100 w/APG option, 128 pins | COM87 | |
| HP 83000 | VLSI Tester | COM108 | |
| HP 83000 | E2811, 256 pins | COM49 | |
| HP 83000 F120T | VLSI Tester 48 pins | COM135 | |
| HP 83000 F330T | VLSI Tester 224 pins | COM50 | |
| HP 83000 660I | VLSI Tester 96 Pins | COM24 | |
| HP 83000 F330T | VLSI Tester 80 Mhz 400 pins | COM13 | |
| HP 83000 F330T | VLSI Tester 120 Mhz 480 pins | COM18 | |
| HP 83000 F330T | VLSI Tester 330 Mhz 224 Pins/1 Meg | COM22 | |
| HP 83000 F330T | VLSI Tester 120 Mhz 336 pins 1 Meg | COM43 | |
| HP 83000 F330T | VLSI Tester 120 Mhz 256 pins 4 Meg | COM136 | |
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HP 84000 A120T / Agilent 84000 A120T |
RF Tester | COM335 | |
| HP 94000 | Spare Parts Machine | COM243 | |
| HP 94000XL-IP | Mixed Signal Tester | COM279 | |
| HP 94000XL-IP | Mixed Signal Tester | COM280 | |
| Jetlight 9290 | EEPROM Chip Eraser | COM193 | |
| Megatest GII | Memory Tester | COM85 | |
| Megatest GII | Memory Tester | COM86 | |
| Mosaid MS4155 | Memory Tester Parts Machine | COM220 | |
| Mosaid MS4155 | Memory Tester | COM272 | |
| Mosaid MS3480 | Memory Tester | COM245 | |
| Mosaid MS3495 | Memory Tester | COM146 | |
| Novtek | Flash Cycler NTS 2200 | COM109 | |
| RVSI GS7100 | GS-7100 Lead Scanner | COM186 | |
| RVSI LS7100 | LS-7100 | COM328 | |
| RVSI LS7100 | LS-7100 Lead Scanner | COM73 | |
| RVSI LS7700 | LS-7700 Lead Scanner | COM116 | |
| RVSI LS7700 | LS-7700 Lead Scanner | COM322 | |
| RVSI LS3900 | LS-3900DB Lead Scanner | COM119 | |
| RVSI LS3700 | LS-3700DB Lead Scanner | COM128 | |
| SENTRY/ Fairchild/Schlumberger S21/S20 | 20 Mhz Digital Tester | COM5 | |
| SENTRY/Fairchild/Schlumberger S10 | 10 Mhz Digital Tester | COM6 | |
| SENTRY/Fairchild/Schlumberger Sentinel | Digital Tester | COM7 | |
| Sentry/Fairchild/Schlumberger EXA3000 | NP Tester | COM297 | |
| Sentry/Fairchild/Schlumberger ITS 9000KX | VLSI Logic Test System 664 pins | COM88 | |
| Sentry/Fairchild/Schlumberger ITS 9000KX | VLSI Logic Test System 376 pins | COM89 | |
| Sentry/Fairchild/Schlumberger S1650 | Digital IC Test System, 50 Mhz, 256 pins | COM12 | |
| Sentry/Fairchild/Schlumberger S790 | Parts Machine | COM303 | |
| Teradyne Catalyst | D200 Test System with 384 Pins | COM259 | |
| Teradyne A567 | Mixed Signal Test System | COM139 | |
| Teradyne A575 | Parts Machine | COM207 | |
| Teradyne A575 | Parts Machine | COM336 | |
| Teradyne A585 | COM184 | ||
| Teradyne J937 | Memory Test System, 50 MHZ Mem Tester | COM8 | |
| Teradyne J937 | Memory Test System, 100 MHZ | COM9 | |
| Teradyne J971 | VLSI Logic Test System, 100 Mhz | COM23 | |
| Teradyne J993 | Memory Test System | COM40 | |
| Teradyne J995 | Memory Test System | COM42 | |
| Teradyne J997 | Memory Test System | COM26 | |