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| Component Testers | ||
| Model | Description | Ref # | |
| Advantest 5381 | Memory Tester | COM10 | |
| Advantest 5365P | COM53 | ||
| Advantest 3323 | Component Tester | COM38 | |
| Advantest 3324 | VLSI Tester 256 pin test heads | COM20 | |
| Advantest 3324 | VLSI Tester 128 pin test heads | COM21 | |
| Agilent 4072 | (HP 4072) Parametric Tester | COM27 | |
| Agilent 4062 UX | HP 4062UXParametric Tester | COM63 | |
| Agilent 4062 UX | HP 4062UX Parametric Tester | COM64 | |
| Agilent 4062 UX | HP 4062UX Parametric Tester | COM65 | |
| Agilent Versatest 1208 | Tester | COM66 | |
| Agilent Versatest 3301 | Memory Tester | COM67 | |
| Credence Cal Station | Credence Calibration Station for Credence Quartet and Credence Duo's | COM28 | |
| Credence Vista Vision | Vista Vision XP Test System | COM35 | |
| Credence ACS2 | Calibration Station for Vista Testers | ||
| Eagle LSI-5XP | Analog Test System | COM1 | |
| Espec/Tabai WBD-02CU | Wafer Burn in System | COM51 | |
| HILEVEL ETS300 | IC Tester | COM15 | |
| HILEVEL ETS300 | IC Tester | COM16 | |
| HP82000 | D100 VLSI Logic Tester | COM4 | |
| HP82000 | D200 | COM3 | |
| HP82000 | D100 | COM19 | |
| HP 83000 | COM49 | ||
| HP 83000 | COM50 | ||
| HP83000 | VLSI Tester 96 Pins | COM24 | |
| HP83000 F330T | VLSI Tester 80 Mhz 400 pins | COM13 | |
| HP83000 F330T | VLSI Tester 120 Mhz 480 pins | COM18 | |
| HP 83000 | VLSI Tester 330 Mhz 224 Pins/1 Meg | COM22 | |
| HP 83000 F330T | VLSI Tester 120 Mhz 336 pins 1 Meg | COM43 | |
| HP 83000 F330T | VLSI Tester 330 Mhz 384 pins 8 Meg | COM45 | |
| HP 95000 | 512 Channel Test Head 1M Vector Logic Memory | COM17 | |
| Lorlin Impact 3 | Transistor/Diode Tester | COM4 |
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| LTX Synchromaster | Mixed Signal IC Test System |
COM39 |
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| LTX TS80 | Component Tester | COM58 | |
| LTX DX90 | Component Tester | COM59 | |
| LTX TS88 | Component Tester | COM60 | |
| LTX CP100 | Component Tester | COM61 | |
| Mosaid M4105 | Memory Tester | COM25 | |
| Mosaid 4155 | Component Tester |
COM32 |
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| RVSI | 7700 Laser Scan | COM34 | |
| RVSI | 3900DB Laser Scan | COM31 | |
| SENTRY | S21/S20 | COM5 | |
| SENTRY | S-10 Or S10B | COM6 | |
| SENTRY | Sentinel | COM7 | |
| SENTRY 90 | Memory Tester | COM47 | |
| Schlumberger S1650 | Tester | COM12 | |
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Schlumberger IDS 10000 |
Ebeam Tester | COM11 | |
| STS 6120 | COM68 | ||
| Teradyne A575 | 50 MHz Mixed Signal Test System 64 Pin | COM46 | |
| Teradyne J921SP | VLSI Tester | COM14 | |
| Teradyne J937 | 50 MHZ Mem Tester | COM8 | |
| Teradyne J937 | 100 MHZ Mem Tester | COM9 | |
| Teradyne J971 | Tester | COM23 | |
| Teradyne J993 | Memory Tester | COM40 | |
| Teradyne J994 | Memory Tester | COM41 | |
| Teradyne J995 | Memory Tester | COM42 | |
| Teradyne J997 | Memory Tester | COM26 | |
| Thermonics T2420 | Temperature Forcing System | COM36 | |
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